Sample Preparation Tools
Cressington 208HR Sputter Coater
This instrument is capable of coating a wide variety of samples with a thin layer of PdPt for SEM observation. This conductive layer is applied to specimens to avoid charging and improve the secondary electron signal.
Fischione 1060 SEM Ion Mill (currently down)
The Fischione Ion Mill is mainly used to mill thin sections of specimens for SEM observation, but it is also capable of enhancing the surface characteristics of samples before EBSD analyses.
Specifications:
- Two TrueFocus ion sources
- Variable energy operation from 100 eV to 6.0 keV
- Adjustable beam diameter (focus)
- Choice of single or dual ion source operation
- Beam current density up to 10 mA/cm2
- Milling angle variable from 0 to 10 degrees
- Automatic height sensing (max dimensions 1 in diameter by 0.59 in high)
- Sample rotation or sample rocking
Fischione 1020 Plasma Cleaner
The plasma cleaner is used to remove existing carbonaceous debris from the specimen and prevents contamination from occurring during imaging and analysis. The instrument is also useful for cleaning TEM holders.
Specifications:
- Power supply: High-frequency (13.56 MHz) oscillating power supply that initiates and sustains a low-energy, inductively coupled plasma
- Process gas: a mixture of 75% argon and 25% oxygen
- Compatible with side entry holders manufactured by various companies
Microtome RMC
VibroMet 2 Vibratory Polisher (at EPS building)
This instrument is capable of polishing samples to a mirror-surface finish.To access this instrument, please contact us. Note that you need to bring your own slurry solution.
For quick Best Practices and How to Operate the VibrMet 2, please watch this video.