Sample Preparation Tools

The NCF has a dedicated space for Sample Preparation that is available to all authorized users. Access to these instruments requires basic training and approval by Staff. 

Cressington 208HR Sputter Coater

Cressington Ion Mill

This instrument is capable of coating a wide variety of samples with a thin layer of PdPt for SEM observation. This conductive layer is applied to specimens to avoid charging and improve the secondary electron signal.


Fischione 1020 Plasma Cleaner

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The plasma cleaner is used to remove existing carbonaceous debris from the specimen and prevents contamination from occurring during imaging and analysis. The instrument is also useful for cleaning TEM holders.

Specifications:
  • Power supply: High-frequency (13.56 MHz) oscillating power supply that initiates and sustains a low-energy, inductively coupled plasma 
  • Process gas: a mixture of 75% argon and 25% oxygen
  • Compatible with side entry holders manufactured by various companies 

 

Microtome RMC 

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The microtome RMC model MT XL is used for the preparation of ultra-thin sections for electron microscopy and thin sections for optical microscopy. The instrument is equipped with a digital section counter and feed totalizer, and it has been designed with a high-stability mechanical drive system for specimen advancement and cutting.
We also have available a glass knife maker and water through filler accessories. 
*We encourage users to have their own diamond blades.

VibroMet 2 Vibratory Polisher (at EPS building)

This instrument is capable of polishing samples to a mirror-surface finish. To access this instrument, please contact us. Note:  Users need to bring their own slurry solution and buy their own pads.  Consumables can be found here. 

For quick Best Practices and How to Operate the VibrMet 2, please watch this video.

 

Fischione 1060 SEM Ion Mill (currently down)

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The Fischione Ion Mill is primarily used to mill thin sections of specimens for SEM observation; however, it is also capable of enhancing the surface characteristics of samples before EBSD analysis.

Specifications:
  • Two TrueFocus ion sources
  • Variable energy operation from 100 eV to 6.0 keV
  • Adjustable beam diameter (focus)
  • Choice of single or dual ion source operation
  • Beam current density up to 10 mA/cm2
  • Milling angle variable from 0 to 10 degrees
  • Automatic height sensing (max dimensions 1 in diameter by 0.59 in high)
  • Sample rotation or sample rocking