Gallery

Images Taken with our Instruments

 HRTEM Micrograph of CoCe mixed oxide. Courtesy of H.N. Pham    

HRTEM micrograph obtained from a sample of Ce-Co mixed oxide taken with our JEOL NEOARM 200CF (courtesy of H.N. Pham, Datye Group).

 

ABFADF

AC-STEM micrographs obtained from the interface of a biphasic Janus particle consisting of PdPt (courtesy of S. Porter, the Datye's Group).

 

semiconductors interface

AC-STEM ADF micrograph showing the interface of two semiconductors  (courtesy of D. Shima and L. Miroshnik, the Balakrishnan Group).

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AC-STEM ADF micrograph showing the interfaces of two-layered semiconductors  (courtesy of D. Shima from the Balakrishnan Group).

 

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AC-STEM ADF micrograph showing CeO2 catalyst and scattered Pt single atoms at the surface (courtesy of H.N. Pham, Datye's Group).

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AC-STEM ADF image of a catalyst sample courtesy of Kui Li from the Materials Synthesis and Integrated Devices Group at LANL. Left, original. Right, digitally filtered with DM.