microCT

Zeiss Xradia Context Micro Computed Tomography

The  Xradia Context microCT, is a large field of view, nondestructive 3D X-ray micro-computed tomography system that allows to perform 3D characterization and inspection of a vast range of materials. This system provides imaging solutions for different needs, spanning from large intact samples to revealing interior details in their full 3D context, as well as small samples at maximum geometric magnification to resolve fine features with high resolution and high contrast.

Features:

• Target: Tungsten (transmission target mechanism)
• X-ray Source Voltage: 160 kV 
• Spatial Resolution: 0.95 microns
• Max achievable voxel (voxel size at sample at max magnification): 0.5 microns
• CMOS, pixel array: 3072 x 1944
• Equipped with several source filters to improve image quality in dense samples
• Stage Load Capacity: 25 kg; maximum sample size (diameter / height) 300 mm / 300 mm
• Sample Stage Travel, X, Y, Z: 50 mm, 100 mm, 50 mm
• Stage Rotation: 360 degrees
• Source Travel, Z direction (along X-ray beam path): 190 mm
• Detector Travel (along X-ray beam path): 475 mm
• Sample Holders: screw clamp (for semiconductors, flat, no thicker than 10 mm), spring clamp (for semiconductors, flat, no thicker than 5 mm), pin vise (for solids, less than 3 mm diameter), sample base (soft biological)